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2022-09-24 18:08:59
FLASH memory ATO25D1GA-10ED original spot
ATO25D1GA-10ED: FLASH memory. Company advantage inventory.
feature
generally
Serial Peripheral Interface
? Mode 0 and Mode 3
Standard, Quad SPI
?Standard SPI: SCLK, CS#, SI, SO
?Quad SPI: SCLK, CS#, SIO0, SIO1,
SIO2/W#, SIO3/Hold# Single Supply Operation
?Full voltage range: 2.7V to 3.6V read, erase
and program operation
organize
? Memory cell array: (128M + 4M) x bytes
Data register: (2048 + 64) x bytes
Automatic programming and erasing
? Page Program: (2048 + 64) x bytes ? Block Erase: (128K + 4K) x bytes =
64 pages
page read operation
?page size: (2048 + 64) bytes
?page read (cell array to page buffer):
25us (max)
?Serial page access: 104MHz,
133MHz (CL = 15pF)
fast write cycle
?Programming time: 200us (Typ.)
? Block erase time: 2ms (Typ.)
Electronic identification
? JEDEC standard 1-byte manufacturer ID and 1-byte device ID.
Write-back program operation
? No external fast page copying required
buffer
security function
?OTP area, 16K bytes (8 pages)
?
hardware data protection
? Program/Erase is locked during power-up
transition. ?W# pin with
Status Register Bit Protection
the specified storage area. state
Register Block Protection Bits (BP2,
BP1, BP0) configuration in the status register
Part of the memory is read-only
data integrity
?Endurance: 100K program/erase
number of cycles
Data retention period: 10 years
error management
?Internal ECC code generation
?1bit/528bytes ECC, 1NOP/528bytes
Bag
?8 pieces of 8x6 WSON
?16-pin SOIC 300 million
General Instructions
ATO25D1GA is 1Gbit with 32Mbit spare capacity. The device operates from a 3.3V supply
supply. Its NAND cells provide the most cost-effective solution for solid-state mass storage
market. The memory is divided into blocks that can be erased independently, so it is possible to
Retain valid data while deleting old data. The device contains 1024 blocks, consisting of
64 pages, consisting of two NAND structures of 32 flash memory cells connected in series. a program
Operations can be performed on a typical 200us of 2048 bytes, and erase operations can be performed.
Executes in a typical time of 2ms on 128Kbyte blocks. The data in the page can be read out in 25ns
Cycle time per byte. On-chip write control automates all program and erase functions
Includes pulse repetition if necessary and internal verification and data margins. even
Write-intensive systems can take advantage of the extended reliability of the ATO25D1GA
100K program/erase cycles by providing ECC (Error Correcting Code) in real time
mapping algorithm.
?ATO25D1GA has serial peripheral interface and software protocol to allow operation
Operates on a simple 3-wire bus when in single I/O mode. These three signals are the clock input (SCLK),
Serial Data In (SI) and Serial Data Out (SO). Enable serial access to the device by
CS# input. When in the four I/O read mode, the SI pin, SO pin, WP# pin and HOLD# pin
Become the SIO0 pin, SIO1 pin, SIO2 pin, SIO3 pin for address/virtual bit input and data output.
The copy function can optimize defective block management:
Program operation fails, data can be programmed directly in another page of the same page
Array part without the time-consuming serial data insertion stage. ATO25D1GA is
Large non-volatile storage applications such as solid-state file storage and
Other portable applications requiring non-volatile.
?Automatic program/erase algorithm after issuing program/erase command
Program/erase and confirm that the specified page or sector/block location will be performed. depending on
2 KB can be programmed at a time. Pages can be erased in erase groups of 128KB. to
Provides a convenient interface for the user, including a status register to indicate the user's status
chip. Status read commands can be issued to detect the completion status of the program or
The erase operation is performed through the OIP bit. Advanced security features enhance protection and safety features
