SiC Power MOSFET and Diode Gate Drive Evaluation Board Kit

Littelfuse Technology IXYS Gate Driver Evaluation Board Analyzes System-Level Impact of SiC Design

Image of SiC Power MOSFET and Diode Gate Drive Evaluation Board Kit IXYS, a technology of Littelfuse, has developed gate driver evaluation boards for SiC MOSFETs and diodes. The GDEV system consists of a main board into which a gate driver module board can be inserted, enabling users to analyze system-level impacts associated with SiC-based designs. It has the ability to compare the performance of different gate driver half-bridge configuration solutions under well-defined and optimized test conditions. In addition, GDEV provides a test gate drive circuit under continuous operating conditions to evaluate the thermal performance and EMI immunity of the gate driver.

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Application Note: Gate Driver Evaluation Platform

Product Catalog: Power Semiconductor Product Catalog

Product Spotlight: Power Semiconductors - Silicon Carbide (SiC) Portfolio

White Paper: The State of SiC MOSFETs: Device Development, Technical Benefits and Business Prospects

Video: Going Mainstream with SiC: The Littelfuse Power Semiconductor Story

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Evaluate continuous operation of SiC power MOSFETs and diodes at rated voltage and current

Compare the performance of different gate driver solutions under well-defined and optimized test conditions.

Test gate drive circuits under continuous operating conditions to evaluate gate driver thermal performance and EMI immunity